ROUND TRIP DELAY AND PATH APPLICATIONS FOR FAULTY NODE DETECTION IN WIRELESS SENSOR NETWORK

Authors

  • SWATI SHESHERAO DHONDGE M.E.Scholar, Department of E&TC, Deogiri Institute of Engineering and Management Studies, Aurangabad (M.S.), India
  • PROF. A. R. WADHEKAR Assistant Professor, Department of E&TC, Deogiri Institute of Engineering and Management Studies, Aurangabad (M.S.), India

Keywords:

Wireless network, Faulty node, delay,, path,

Abstract

For some years, wireless sensor networks (WSNs) applications have increased because of its great potential to connect the physical world with the virtual world. Likewise, advances in microelectronic manufacturing technology reduce the cost of making portable wireless sensors. It becomes a fashion to apply the large number of portable wireless sensors to WSN to improve quality of service (QoS). QoS such WSNs is mainly influenced by the failure of sensor nodes. The likelihood of increased mote increases with increasing number of sensors. In order to maintain the best QoS in fault conditions,identification and release of such failures are essential. In the proposed method, the defective sensor node is detected by measuring the round trip delay (RTD) of discrete round trip paths (RTP) and comparing the threshold value. There are two nodes of sensors and a master node, communication between these nodes is established through Zigbee wireless technology.

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Published

2021-03-27

Issue

Vol. 4 No. 4 (2017): IJIERT

Section

Articles

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