KISHOR JADHAV; HANAMANT MALLAD. OPEN-CIRCUIT FAULT DIAGNOSIS IN VSI BY SIMPLE DIRECT CURRENT METHOD. International Journal of Innovations in Engineering Research and Technology, Maharashatra, India, p. 193–199, 2022. Disponível em: https://repo.ijiert.org/index.php/ijiert/article/view/3222. Acesso em: 4 dec. 2025.